Optimal design of accelerated life tests under periodic inspection

Naval Research Logistics (NRL) ◽

10.1002/1520-6750(198912)36:6<779::aid-nav3220360604>3.0.co;2-2 ◽

1989 ◽

Vol 36 (6) ◽

pp. 779-795 ◽

Author(s):

Bong-Jin Yum ◽

Seung-Cheol Choi

Keyword(s):

Optimal Design ◽

Periodic Inspection ◽

Accelerated Life Tests ◽

Accelerated Life ◽

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Optimal design of accelerated life tests for the Weibull distribution under periodic inspection and type I censoring

Microelectronics Reliability ◽

10.1016/0026-2714(94)90453-7 ◽

1994 ◽

Vol 34 (9) ◽

pp. 1459-1468 ◽

Author(s):

A. Islam ◽

N. Ahmad

Keyword(s):

Optimal Design ◽

Weibull Distribution ◽

Type I ◽

Periodic Inspection ◽

Type I Censoring ◽

Accelerated Life Tests ◽

Accelerated Life ◽

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Optimal design of simple step-stress accelerated life tests for one-shot devices under Weibull distributions

Reliability Engineering & System Safety ◽

10.1016/j.ress.2019.106630 ◽

2020 ◽

Vol 193 ◽

pp. 106630 ◽

Author(s):

M.H. Ling ◽

X.W. Hu

Keyword(s):

Optimal Design ◽

Weibull Distributions ◽

Accelerated Life Tests ◽

Accelerated Life ◽

Simple Step ◽

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Inference and Optimal Design Based on Step—Partially Accelerated Life Tests for the Generalized Pareto Distribution under Progressive Type-I Censoring

Communications in Statistics - Simulation and Computation ◽

10.1080/03610918.2013.826363 ◽

2014 ◽

Vol 44 (7) ◽

pp. 1750-1769 ◽

Author(s):

Alaa H. Abdel-Hamid ◽

Essam K. Al-Hussaini

Keyword(s):

Optimal Design ◽

Pareto Distribution ◽

Generalized Pareto Distribution ◽

Type I ◽

Type I Censoring ◽

Accelerated Life Tests ◽

Generalized Pareto ◽

Accelerated Life ◽

Progressive Type ◽

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Simulation-based Bayesian optimal design for multi-factor accelerated life tests

Communications in Statistics - Simulation and Computation ◽

10.1080/03610918.2014.988253 ◽

2016 ◽

Vol 46 (2) ◽

pp. 980-993 ◽

Author(s):

Ehab Nasir ◽

Rong Pan

Keyword(s):

Optimal Design ◽

Accelerated Life Tests ◽

Accelerated Life ◽

Simulation Based ◽

Bayesian Optimal Design ◽

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Optimal design of partially accelerated life tests for the exponential distribution under type-I censoring

Microelectronics Reliability ◽

10.1016/0026-2714(93)90418-x ◽

1993 ◽

Vol 33 (13) ◽

pp. 2065

Keyword(s):

Optimal Design ◽

Exponential Distribution ◽

Type I ◽

Type I Censoring ◽

Accelerated Life Tests ◽

Accelerated Life ◽

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Optimal design of partially accelerated life tests for the exponential distribution under type-I censoring

IEEE Transactions on Reliability ◽

10.1109/24.159807 ◽

1992 ◽

Vol 41 (3) ◽

pp. 400-406 ◽

Author(s):

D.S. Bai ◽

S.W. Chung

Keyword(s):

Optimal Design ◽

Exponential Distribution ◽

Type I ◽

Type I Censoring ◽

Accelerated Life Tests ◽

Accelerated Life ◽

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Optimal design of accelerated life tests with two stresses

Naval Research Logistics (NRL) ◽

10.1002/(sici)1520-6750(199609)43:6<863::aid-nav5>3.0.co;2-2 ◽

1996 ◽

Vol 43 (6) ◽

pp. 863-884 ◽

Author(s):

Jung-Won Park ◽

Bong-Jin Yum

Keyword(s):

Optimal Design ◽

Accelerated Life Tests ◽

Accelerated Life ◽

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Planning constant‐stress accelerated life tests with multiple stresses based on D‐optimal design

Quality and Reliability Engineering International ◽

10.1002/qre.2720 ◽

2020 ◽

Author(s):

Xiangxiang Zhang ◽

Jun Yang ◽

Xuefeng Kong

Keyword(s):

Optimal Design ◽

Constant Stress ◽

Multiple Stresses ◽

Accelerated Life Tests ◽

Accelerated Life ◽

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Optimal design of accelerated life tests for an extension of the exponential distribution

Reliability Engineering & System Safety ◽

10.1016/j.ress.2014.04.017 ◽

2014 ◽

Vol 131 ◽

pp. 251-256 ◽

Author(s):

Firoozeh Haghighi

Keyword(s):

Optimal Design ◽

Exponential Distribution ◽

Accelerated Life Tests ◽

Accelerated Life ◽

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Optimal design of partially accelerated life tests for the lognormal distribution under type I censoring

Reliability Engineering & System Safety ◽

10.1016/0951-8320(93)90122-f ◽

1993 ◽

Vol 40 (1) ◽

pp. 85-92 ◽

Author(s):

D.S. Bai ◽

S.W. Chung ◽

Y.R. Chun

Keyword(s):

Optimal Design ◽

Lognormal Distribution ◽

Type I ◽

Type I Censoring ◽

Accelerated Life Tests ◽

Accelerated Life ◽

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